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Active Layer Parametrics
About
We have developed a system to rapidly and accurately measure mobility and activated carrier concentration profiles
Details
- Last Funding Type
- Grant
- Last Funding Money Raised
- $149.99K
- Founded date
- Jan 1, 2014
- Operating Status
- Active
Active Layer Parametrics (ALP Inc.) has developed a system to rapidly and accurately measure mobility and activated carrier concentration profiles with Angstrom-level resolution for the semiconductor manufacturing industry. These profiles detail the depth of electrical activation due to implant-anneal recipes. We're the only system in the world that is capable of doing these measurements on a routine basis. The goal of the company is: Improve Yield by Quick Feedback: Instead having to wait for weeks to get devices made, we could do that in a matter of minutes. Improve Device performance: By tracking process changes to electronic impact - we currently do this 'matrix-analysis'.
Funding Rounds
| Announced Date | Round | Money Raised | Number of Investors | Lead Investors | Post Valuation | |
|---|---|---|---|---|---|---|
| Sep 10, 2019 | Grant | $224.99K | 1 |
National Science Foundation
|
— | Detail |
| Jul 31, 2016 | Grant | $1.11M | 1 |
National Science Foundation
|
— | Detail |
| Jun 1, 2015 | Grant | $149.99K | 1 |
National Science Foundation
|
— | Detail |
Investors
| Investor Name | Lead Investor | Funding Round |
|---|---|---|
|
National Science Foundation
|
Yes | Grant |
